Sem/eds analysis laboratories with Microvisionlabs.com? MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile.
MicroVision Laboratories’ analytical experts were able to meet with the QC Engineers and develop an analytical plan as to which solder joints to cross section and inspect. The client not only wanted to determine if there were any significant issues with the solder joint but also determine that there was a good intermetallic bond between the tin/lead solder and the copper wires of the chip packages. Read a few extra info on microvisionlabs.com.
The client was contacted with the results, and was curious as to what the source of these particles might be. After consulting with the office manager, it was determined that some pieces of furniture present had relatively significant amounts of direct water exposure, and were subsequently dried a number of times during remittance construction. Inspection of these pieces of furniture showed that they had high density, close packed foam cushions of a type similar to the particles observed in the surrounding area, which had been broken down by the repeated wet/dry cycle.
What if I want a service not listed in your services list? At MicroVision Labs the list of services which we provide to our clients is constantly growing. So if you don’t see what you are looking for give us a call or use the Contact Us tab. Also don’t forget to check our Additional Services Page to see if it might be listed there. Can you identify a contamination or unknown for us? Yes, we call that an Unknown Material ID and we routinely work on that kind of project. We have a number of individual tests designed to classify unknown materials. When combined with our extensive suite of equipment, these tests allow us to identify virtually any material. Give us a call and talk to one of our knowledgeable staff for more information.
SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects. Explore a few extra details on here.
Analysis and Results: The submitted bottle was examined for signs of interior distress, and the water from the bottle was removed and maintained. Some of the suspended particulate was filtered and examined non-destructively by light microscopy first, to characterize the material. A low magnification stereo microscope image of the filtered white particulate is shown in the image above. From this image, biological tissues were ruled out, and the material was observed to be crystalline. Polarized light microscopy (PLM) was used to analyze the sample next. From this examination, the material showed birefringence as shown in the PLM image on the right. The PLM Image Stereo Microscope image suspect material showed optical properties and morphology dissimilar to common carbonates and sulfates. It was determined to be a birefringent crystalline material, but it could not be identified using only PLM methods. Therefore, analysis using scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM-EDS) would have to be performed to obtain further information about the suspect material.